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Reports until 12:10, Thursday 20 June 2024
GQuEST General
Torrey Cullen - posted 12:10, Thursday 20 June 2024 (11676)
Testing silicon wafers

[Torrey, Sander, Erin, Briana]

General notes from initial tests of silicon wafer mirrors.

-They came out of the box with visible amounts of dust on them.

-We need a mirror mount that allows for small thickness mirrors. Using the colored mirror mounts in the mean time.

-Turn power down at power distribution to 10 mW coming out of the MISC path. Use this for measuring 1550.

1550 on the wafer mirror

-10.2 mW input / 5.6 mW tranmission - normal incidence

-10.2 mW input / 5.8 mW reflection - 45 AOI

775 on the wafer mirror 

-3.5 mW input / transmission too small to measure - normal incidence

-3.5 mW input / 1.0 mW reflection - 45 AOI

Displaying report 1-1 of 1.